Royce Dual Beam FIB

Overview

For fabrication and nanopatterning capabilities please watch our short video:

Please allow social and marketing cookies to show embedded content.

View content (opens www.youtube.com in a new tab)

The Dual Beam FIB provides a unique capability for the fabrication of 3D heterostructures, allowing for the creation of novel superconducting, magnetic or optical devices. Dr John Warmsley in The Wolfson Electron Microscopy Suite (WEMS) runs the equipment and provides technical and science support. Access to this equipment is managed by WEMS - click here for access information.

Equipment

Dual beam FIB

Royce Dual beam microscope

Zeiss Crossbeam 540 is a Dual Beam microscope which combines high resolution field emission scanning electron microscopy (FE-SEM) and advanced focussed ion beam (FIB) processing.

Facilities available on this instrument include: Gas deposition nozzle with SiO2, XeF2 Platinum, Carbon and H2O. Kleindiek lift-out system.

Managed by John Warmsley.